Disco rovinato?
Andrea Occhi
camicius a gmail.com
Mar 6 Nov 2007 18:10:04 UTC
Ciao a tutti.
Nel fare un controllo con smart sui dischi di un fileserver che
abbiamo in azienda, mi sono accorto che c'erano degli errori nei
self-test.
Fatto un test lungo il risultato è questo:
sysadm a alfa:~$ sudo smartctl -l selftest /dev/hdb
=== START OF READ SMART DATA SECTION ===
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining
LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed: read failure 40% 2797
279625
# 2 Extended offline Completed: read failure 40% 1098
279625
ho seguito queste
(http://smartmontools.sourceforge.net/BadBlockHowTo.txt) istruzioni
per fare riallocare il blocco, ma arrivato al Fourth step, mi blocco
perchè
sysadm a alfa:~$ sudo debugfs
debugfs 1.40-WIP (14-Nov-2006)
debugfs: open /dev/hdb1
debugfs: inode 34935
debugfs: Unknown request "inode". Type "?" for a request list.
debugfs: icheck 34935
Block Inode number
34935 <block not found>
La partizione è abbastanza vuota (8%) e purtroppo enorme (41G).
Ho dei dubbi sul calcolo del numero di blocco, ma l'ho fatto 2-3 volte
e il risultato è sempre lo stesso.
Ovviamente i dati sono sottoposti a backup giornaliero-settimanale-mensile.
La domanda è: quanto può reggere? quanto è rischioso?
Devo farlo cambiare al più presto o posso aspettare un po'?
Qualcuno ha qualcosa di diverso da farmi leggere?
Accodo per completezza lo smartctl -a /dev/hdb.
grazie in anticipo
Andrea
sysadm a alfa:~$ sudo smartctl -a /dev/hdb
smartctl version 5.36 [i686-pc-linux-gnu] Copyright (C) 2002-6 Bruce Allen
Home page is http://smartmontools.sourceforge.net/
=== START OF INFORMATION SECTION ===
Model Family: Maxtor DiamondMax Plus 45 Ulta ATA 100 family
Device Model: Maxtor 54610H6
Serial Number: F60728PC
Firmware Version: JAC61HU0
User Capacity: 46,103,371,776 bytes
Device is: In smartctl database [for details use: -P show]
ATA Version is: 6
ATA Standard is: ATA/ATAPI-6 T13 1410D revision 0
Local Time is: Tue Nov 6 19:09:25 2007 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
See vendor-specific Attribute list for marginal Attributes.
General SMART Values:
Offline data collection status: (0x80) Offline data collection activity
was never started.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 116) The previous self-test completed having
the read element of the test failed.
Total time to complete Offline
data collection: ( 30) seconds.
Offline data collection
capabilities: (0x1b) SMART execute Offline immediate.
Auto Offline data collection
on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
No Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
No General Purpose Logging support.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 31) minutes.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE
UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000a 253 252 000 Old_age
Always - 11
3 Spin_Up_Time 0x0027 173 172 063 Pre-fail
Always - 21842
4 Start_Stop_Count 0x0032 253 253 000 Old_age
Always - 220
5 Reallocated_Sector_Ct 0x0033 094 085 063 Pre-fail
Always - 401
6 Read_Channel_Margin 0x0001 253 253 100 Pre-fail
Offline - 0
7 Seek_Error_Rate 0x000a 253 252 000 Old_age
Always - 0
8 Seek_Time_Performance 0x0027 252 247 187 Pre-fail
Always - 61078
9 Power_On_Minutes 0x0032 245 245 000 Old_age
Always - 803h+33m
10 Spin_Retry_Count 0x002b 229 214 223 Pre-fail
Always In_the_past 16
11 Calibration_Retry_Count 0x002b 253 252 223 Pre-fail
Always - 0
12 Power_Cycle_Count 0x0032 249 249 000 Old_age
Always - 1623
196 Reallocated_Event_Count 0x0008 253 253 000 Old_age
Offline - 0
197 Current_Pending_Sector 0x0008 001 001 000 Old_age
Offline - 386
198 Offline_Uncorrectable 0x0008 252 252 000 Old_age
Offline - 1
199 UDMA_CRC_Error_Count 0x0008 199 199 000 Old_age
Offline - 1
200 Multi_Zone_Error_Rate 0x000a 253 252 000 Old_age
Always - 0
201 Soft_Read_Error_Rate 0x000a 253 252 000 Old_age
Always - 0
202 TA_Increase_Count 0x000a 253 252 000 Old_age
Always - 0
203 Run_Out_Cancel 0x000b 253 252 180 Pre-fail
Always - 0
204 Shock_Count_Write_Opern 0x000a 253 252 000 Old_age
Always - 0
205 Shock_Rate_Write_Opern 0x000a 253 251 000 Old_age
Always - 0
207 Spin_High_Current 0x002a 238 233 000 Old_age
Always - 10
208 Spin_Buzz 0x002a 249 243 000 Old_age
Always - 3
209 Offline_Seek_Performnce 0x0024 253 253 000 Old_age
Offline - 0
96 Unknown_Attribute 0x0004 253 253 000 Old_age
Offline - 0
97 Unknown_Attribute 0x0004 253 253 000 Old_age
Offline - 0
98 Unknown_Attribute 0x0004 253 253 000 Old_age
Offline - 0
99 Unknown_Attribute 0x0004 253 253 000 Old_age
Offline - 0
100 Unknown_Attribute 0x0004 253 253 000 Old_age
Offline - 0
101 Unknown_Attribute 0x0004 253 253 000 Old_age
Offline - 0
SMART Error Log Version: 1
Warning: ATA error count 8334 inconsistent with error log pointer 5
ATA Error Count: 8334 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 8334 occurred at disk power-on lifetime: 436 hours (18 days + 4 hours)
When the command that caused the error occurred, the device was in
an unknown state.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 00 0b 4f c2 f0 Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
b0 da 00 01 4f c2 f0 08 02:50:09.776 SMART RETURN STATUS
ec 00 00 01 00 00 f0 08 02:50:09.776 IDENTIFY DEVICE
c8 00 08 6f 00 00 f3 08 02:45:03.744 READ DMA
c8 00 08 6f 10 00 f0 08 02:45:03.744 READ DMA
c8 00 40 a8 ea 30 f5 08 02:45:03.744 READ DMA
Error 8333 occurred at disk power-on lifetime: 431 hours (17 days + 23 hours)
When the command that caused the error occurred, the device was in
an unknown state.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 00 0b 4f c2 f0 Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
b0 da 00 01 4f c2 f0 08 05:11:22.240 SMART RETURN STATUS
ec 00 00 01 00 00 f0 08 05:11:22.224 IDENTIFY DEVICE
b0 da 00 01 4f c2 f0 08 05:12:22.192 SMART RETURN STATUS
ec 00 00 01 00 00 f0 08 05:12:22.176 IDENTIFY DEVICE
ca 00 08 4f 00 00 f0 08 05:06:16.752 WRITE DMA
Error 8332 occurred at disk power-on lifetime: 431 hours (17 days + 23 hours)
When the command that caused the error occurred, the device was in
an unknown state.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 00 0b 4f c2 f0 Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
b0 da 00 01 4f c2 f0 08 05:12:22.192 SMART RETURN STATUS
ec 00 00 01 00 00 f0 08 05:12:22.176 IDENTIFY DEVICE
ca 00 08 4f 00 00 f0 08 05:06:16.752 WRITE DMA
ca 00 08 3f 00 00 f0 08 05:06:16.752 WRITE DMA
ca 00 08 47 14 00 f0 08 05:04:48.320 WRITE DMA
Error 8331 occurred at disk power-on lifetime: 383 hours (15 days + 23 hours)
When the command that caused the error occurred, the device was in
an unknown state.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 00 00 00 00 b0 Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
a1 00 00 01 00 00 b0 00 00:09:01.104 IDENTIFY PACKET DEVICE
c4 00 01 01 00 00 f0 00 00:08:57.520 READ MULTIPLE
c4 00 01 00 00 00 f0 00 00:08:57.520 READ MULTIPLE
c4 00 01 00 00 00 f0 00 00:08:57.440 READ MULTIPLE
b0 d9 10 01 4f c2 b0 00 00:08:55.856 SMART DISABLE OPERATIONS
Error 8330 occurred at disk power-on lifetime: 379 hours (15 days + 19 hours)
When the command that caused the error occurred, the device was in
an unknown state.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
04 51 00 00 00 00 b0 Error: ABRT
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
a1 00 00 01 00 00 b0 00 00:07:55.424 IDENTIFY PACKET DEVICE
c4 00 01 01 00 00 f0 00 00:07:51.840 READ MULTIPLE
c4 00 01 00 00 00 f0 00 00:07:51.840 READ MULTIPLE
c4 00 01 00 00 00 f0 00 00:07:51.808 READ MULTIPLE
b0 d9 10 01 4f c2 b0 00 00:07:50.240 SMART DISABLE OPERATIONS
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining
LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed: read failure 40% 2797
279625
# 2 Extended offline Completed: read failure 40% 1098
279625
Device does not support Selective Self Tests/Logging
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